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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.Three-dimensional orientation mapping in the transmission electron microscope.Non-destructive mapping of grain orientations in 3D by laboratory X-ray microscopy.Three-dimensional full-field X-ray orientation microscopyHeterogeneous grain-scale response in ferroic polycrystals under electric field.Direct observation of grain rotations during coarsening of a semisolid Al-Cu alloy.Multigrain indexing of unknown multiphase materials.Quantification of mineral behavior in four dimensions: Grain boundary and substructure dynamics in salt
P2860
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P2860
description
wetenschappelijk artikel
@nl
наукова стаття, опублікована у вересні 2008
@uk
name
Direct observation of 3-D grain growth in Al–0.1% Mn
@en
Direct observation of 3-D grain growth in Al–0.1% Mn
@nl
type
label
Direct observation of 3-D grain growth in Al–0.1% Mn
@en
Direct observation of 3-D grain growth in Al–0.1% Mn
@nl
prefLabel
Direct observation of 3-D grain growth in Al–0.1% Mn
@en
Direct observation of 3-D grain growth in Al–0.1% Mn
@nl
P2093
P1433
P1476
Direct observation of 3-D grain growth in Al–0.1% Mn
@en
P2093
C. Maurice
D. Juul Jensen
E.M. Lauridsen
H.F. Poulsen
H.O. Sørensen
L. Margulies
U.L. Olsen
P304
P356
10.1016/J.SCRIPTAMAT.2008.04.049
P577
2008-09-01T00:00:00Z