Quantitative comparison of three calibration techniques for the lateral force microscope
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Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope.The extended wedge method: atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.Improved lateral force calibration based on the angle conversion factor in atomic force microscopy.Particle-Particle Interactions: The Link between Aggregate Properties and RheologyNormal and Lateral Force Calibration Techniques for AFM Cantilevers
P2860
Quantitative comparison of three calibration techniques for the lateral force microscope
description
article
@en
im August 2001 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в серпні 2001
@uk
name
Quantitative comparison of three calibration techniques for the lateral force microscope
@en
Quantitative comparison of three calibration techniques for the lateral force microscope
@en-gb
Quantitative comparison of three calibration techniques for the lateral force microscope
@nl
type
label
Quantitative comparison of three calibration techniques for the lateral force microscope
@en
Quantitative comparison of three calibration techniques for the lateral force microscope
@en-gb
Quantitative comparison of three calibration techniques for the lateral force microscope
@nl
prefLabel
Quantitative comparison of three calibration techniques for the lateral force microscope
@en
Quantitative comparison of three calibration techniques for the lateral force microscope
@en-gb
Quantitative comparison of three calibration techniques for the lateral force microscope
@nl
P2093
P2860
P356
P1476
Quantitative comparison of three calibration techniques for the lateral force microscope
@en
P2093
Mark G. Reitsma
Neil W. Page
Robert G. Cain
P2860
P304
P356
10.1063/1.1386631
P577
2001-08-01T00:00:00Z