Quantification of octahedral rotations in strained LaAlO3films via synchrotron x-ray diffraction
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Hidden lattice instabilities as origin of the conductive interface between insulating LaAlO3 and SrTiO3.Tilt engineering of exchange coupling at G-type SrMnO3/(La,Sr)MnO3 interfaces.Phase control of a perovskite transition-metal oxide through oxygen displacement at the heterointerface.Spatially Confined Spin Polarization and magnetic sublattice control in (La,Sr)MnO3-δ Thin Films by Oxygen Vacancy Ordering.Epitaxial-strain-induced polar-to-nonpolar transitions in layered oxides.
P2860
Quantification of octahedral rotations in strained LaAlO3films via synchrotron x-ray diffraction
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im November 2013 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в листопаді 2013
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Quantification of octahedral r ...... synchrotron x-ray diffraction
@en
Quantification of octahedral r ...... synchrotron x-ray diffraction
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type
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Quantification of octahedral r ...... synchrotron x-ray diffraction
@en
Quantification of octahedral r ...... synchrotron x-ray diffraction
@nl
prefLabel
Quantification of octahedral r ...... synchrotron x-ray diffraction
@en
Quantification of octahedral r ...... synchrotron x-ray diffraction
@nl
P2093
P2860
P1433
P1476
Quantification of octahedral r ...... synchrotron x-ray diffraction
@en
P2093
C. M. Schlepütz
D. G. Schlom
D. Marincel
K. T. Delaney
M. P. Warusawithana
N. A. Spaldin
P. J. Ryan
P2860
P356
10.1103/PHYSREVB.88.174101
P407
P577
2013-11-01T00:00:00Z