Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges
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Characterization of organic thin films with resonant soft X-ray scattering and reflectivity near the carbon and fluorine absorption edges
description
article
@en
wetenschappelijk artikel
@nl
наукова стаття, опублікована в червні 2012
@uk
name
Characterization of organic th ...... and fluorine absorption edges
@en
Characterization of organic th ...... and fluorine absorption edges
@nl
type
label
Characterization of organic th ...... and fluorine absorption edges
@en
Characterization of organic th ...... and fluorine absorption edges
@nl
prefLabel
Characterization of organic th ...... and fluorine absorption edges
@en
Characterization of organic th ...... and fluorine absorption edges
@nl
P2860
P356
P1476
Characterization of organic th ...... and fluorine absorption edges
@en
P2093
P2860
P2888
P304
P356
10.1140/EPJST/E2012-01626-Y
P577
2012-06-01T00:00:00Z
P6179
1047400013