Scanning Electron and Optical Light Microscopy: two complementary approaches for the understanding and interpretation of usewear and residues on stone tools
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Scanning Electron and Optical Light Microscopy: two complementary approaches for the understanding and interpretation of usewear and residues on stone tools
description
article
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im August 2014 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в серпні 2014
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name
Scanning Electron and Optical ...... ar and residues on stone tools
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Scanning Electron and Optical ...... ar and residues on stone tools
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type
label
Scanning Electron and Optical ...... ar and residues on stone tools
@en
Scanning Electron and Optical ...... ar and residues on stone tools
@nl
prefLabel
Scanning Electron and Optical ...... ar and residues on stone tools
@en
Scanning Electron and Optical ...... ar and residues on stone tools
@nl
P2093
P1476
Scanning Electron and Optical ...... ar and residues on stone tools
@en
P2093
Antony Borel
Josep Maria Vergès
Robert Sala
P356
10.1016/J.JAS.2013.06.031
P50
P577
2014-08-01T00:00:00Z