Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
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Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.Atomic structures of silicene layers grown on Ag(111): scanning tunneling microscopy and noncontact atomic force microscopy observations.Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
P2860
Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
description
im Februar 2013 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в лютому 2013
@uk
name
Simultaneous noncontact AFM and STM of Ag:Si
@nl
Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
@en
type
label
Simultaneous noncontact AFM and STM of Ag:Si
@nl
Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
@en
prefLabel
Simultaneous noncontact AFM and STM of Ag:Si
@nl
Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
@en
P2093
P2860
P1433
P1476
Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘
@en
P2093
Adam Sweetman
Andrew Stannard
Masayuki Abe
Philip Moriarty
Seizo Morita
Yoshiaki Sugimoto
P2860
P356
10.1103/PHYSREVB.87.075310
P407
P577
2013-02-13T00:00:00Z