qPlus atomic force microscopy of the Si(100) surface: Buckled, split-off, and added dimers
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Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atomsToggling bistable atoms via mechanical switching of bond angle.Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
P2860
qPlus atomic force microscopy of the Si(100) surface: Buckled, split-off, and added dimers
description
im August 2009 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в серпні 2009
@uk
name
qPlus atomic force microscopy ...... d, split-off, and added dimers
@en
qPlus atomic force microscopy ...... d, split-off, and added dimers
@nl
type
label
qPlus atomic force microscopy ...... d, split-off, and added dimers
@en
qPlus atomic force microscopy ...... d, split-off, and added dimers
@nl
prefLabel
qPlus atomic force microscopy ...... d, split-off, and added dimers
@en
qPlus atomic force microscopy ...... d, split-off, and added dimers
@nl
P2093
P356
P1476
qPlus atomic force microscopy ...... d, split-off, and added dimers
@en
P2093
A. Sweetman
N. Berdunov
P. Moriarty
S. Gangopadhyay
P2860
P304
P356
10.1063/1.3197595
P407
P577
2009-08-10T00:00:00Z