Valence fluctuations in thin films and theαandδphases of Pu metal determined by4fcore-level photoemission calculations
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Quantifying the critical thickness of electron hybridization in spintronics materials.Nonresonant inelastic x-ray scattering from actinides and rare earthsMagnetic Linear Dichroism in the Angular Dependence of Core-Level Photoemission from (Ga,Mn)As Using Hard X RaysIdentification of Different Electron Screening Behavior Between the Bulk and Surface of (Ga,Mn)AsElectronic structure of elemental curium studied by photoemission
P2860
Valence fluctuations in thin films and theαandδphases of Pu metal determined by4fcore-level photoemission calculations
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im Juli 2010 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в липні 2010
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name
Valence fluctuations in thin f ...... vel photoemission calculations
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Valence fluctuations in thin f ...... vel photoemission calculations
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type
label
Valence fluctuations in thin f ...... vel photoemission calculations
@en
Valence fluctuations in thin f ...... vel photoemission calculations
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prefLabel
Valence fluctuations in thin f ...... vel photoemission calculations
@en
Valence fluctuations in thin f ...... vel photoemission calculations
@nl
P2860
P1433
P1476
Valence fluctuations in thin f ...... vel photoemission calculations
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P2093
M. Taguchi
P2860
P356
10.1103/PHYSREVB.82.045114
P407
P577
2010-07-16T00:00:00Z