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Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon.High efficiency electron spin polarization analyzer based on exchange scattering at FeW(001).Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer.The role of localized recoil in the formation of Kikuchi patterns.Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications.Tutorial: Crystal orientations and EBSD — Or which way is up?Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imagingDynamical simulations of zone axis electron channelling patterns of cubic silicon carbideMany-beam dynamical simulation of electron backscatter diffraction patternsPerpendicular magnetic anisotropy induced by tetragonal distortion of FeCo alloy films grown on Pd(001)Strongly enhanced orbital moment by reduced lattice symmetry and varying composition of Fe1-xCox alloy filmsUltrafast optical spin injection into image-potential states of Cu(001)Interferometric control of spin-polarized electron populations at a metal surface observed by multiphoton photoemissionDynamical effects of anisotropic inelastic scattering in electron backscatter diffractionBand structure effects in above threshold photoemissionSite-specific recoil diffraction of backscattered electrons in crystalsTwo-photon photoemission study of the coverage-dependent electronic structure of chemisorbed alkali atoms on a Ag(111) surfaceRapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscopeMagnetic dichroism from optically excited quantum well statesAbsolute Structure from Scanning Electron MicroscopyImproving EBSD precision by orientation refinement with full pattern matching
P50
Q30318832-B93C6340-8FB7-41B9-8BED-A14C18E0EA76Q30319251-C58A8CFB-9B4B-4F45-8764-706ECDBAE4CAQ33462150-DA6E0D7E-96BC-4DF7-9BA8-9585F695E61CQ34537267-4D722282-F89D-40F0-99CD-96282F7FC34FQ48062208-6AC25D00-F481-497E-AED2-193A43075036Q56866225-C622CA83-B631-4342-9543-394D4394FBFDQ63958480-E9F8E12B-5004-45EF-AC8B-53394A8707C5Q79278497-D5065B2D-31C4-494B-902B-C69D2689AF8CQ79382202-A50318E2-DB63-407C-BC2E-C24F4F1AF9E9Q80107014-16469F49-F6AC-4D1D-9243-E3D39F28AAB2Q80586182-1BB15E43-80A9-470D-ADC5-F216D45EA205Q80743882-0F1681CF-B8BA-4B72-B59A-AC90C46B1ABFQ81381988-5A8E681A-7385-423B-AA8E-58ACAB8E5229Q81533236-8D54FD7B-CD45-4C6C-835E-44EB8FFAF1B7Q82242084-BF603866-4388-4804-AB78-0DAD7E4560D8Q83616662-4222E227-B575-4C9E-B3E2-282611105344Q83910063-4E2D2664-81F4-4BCB-BE21-3F3C18F559CCQ84024304-A005AB34-B11C-4A80-BD23-516EB642F4D8Q84601331-A97A33DC-4CA6-4FED-ABB3-9828DAA608E5Q90053033-76DBCDED-9E6C-44A0-87C4-1DEE6304CBCEQ93044268-6F623AF4-0F36-4051-B5E2-6C1D84EBA361
P50
description
forsker
@nb
onderzoeker
@nl
researcher, ORCID id # 0000-0002-6534-693X
@en
name
A. Winkelmann
@ast
A. Winkelmann
@nl
Aimo Winkelmann
@en
Aimo Winkelmann
@es
Aimo Winkelmann
@nb
type
label
A. Winkelmann
@ast
A. Winkelmann
@nl
Aimo Winkelmann
@en
Aimo Winkelmann
@es
Aimo Winkelmann
@nb
altLabel
A. Winkelmann
@en
prefLabel
A. Winkelmann
@ast
A. Winkelmann
@nl
Aimo Winkelmann
@en
Aimo Winkelmann
@es
Aimo Winkelmann
@nb
P106
P1153
6701442404
P31
P496
0000-0002-6534-693X