Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
about
Structure and Nanomechanics of Model Membranes by Atomic Force Microscopy and Spectroscopy: Insights into the Role of Cholesterol and SphingolipidsIn situ three-dimensional reciprocal-space mapping during mechanical deformation.An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy.Ultrahigh interlayer friction in multiwalled boron nitride nanotubes.Scanning force microscope for in situ nanofocused X-ray diffraction studies.In situ bending of an Au nanowire monitored by micro Laue diffraction.Versatile atomic force microscopy setup combined with micro-focused X-ray beam.Custom AFM for X-ray beamlines: in situ biological investigations under physiological conditions.Local X-ray magnetic circular dichroism study of Fe/Cu(111) using a tunneling smart tip.KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires.A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures.Three-dimensional diffraction mapping by tuning the X-ray energy.Combined X-ray-Atomic Force Microscopy Tools at the ESRF: The First 10 YearsIn situ observation of the elastic deformation of a single epitaxial SiGe crystal by combining atomic force microscopy and micro x-ray diffraction
P2860
Q28079694-A7AA55E1-E6A4-44A4-A6D5-F6517AEEC4C3Q34382203-7D793826-FE8A-45DA-AA3F-24B28F12A29DQ34791634-1F45F1E8-0371-4EF3-BEDB-FFCB0DF23854Q35177163-43C7B406-BB83-478E-9C8B-663FDB2B607EQ35236191-43D7102F-41FE-419E-B8A6-647E80D3C5DAQ35668149-9C2ED76D-0124-4B79-9289-5C6DB1586115Q35680540-49C96DFF-2CED-4F49-9BF3-43C898474DAAQ35829247-669A7E4D-53E7-4D4F-850A-467C06D941F3Q35936465-9B239A67-1F25-432B-AE77-86E092446FC8Q36175820-3B0E0B5F-152B-492A-94FC-87B7E5A0B30FQ38706255-9869F48C-0B02-4138-8F80-D6F1BDCD3254Q40742032-C4C3AD58-CF0A-4379-A617-B8A50ED170A9Q59058793-3CDC5FB8-9746-4749-BDCA-E32EC745E105Q59058966-3643CBC1-D2C0-4FEF-BD6F-5A88A969EE42
P2860
Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
description
im Januar 2009 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в січні 2009
@uk
name
Probing the elastic properties ...... py and micro-x-ray diffraction
@en
Probing the elastic properties ...... py and micro-x-ray diffraction
@nl
type
label
Probing the elastic properties ...... py and micro-x-ray diffraction
@en
Probing the elastic properties ...... py and micro-x-ray diffraction
@nl
prefLabel
Probing the elastic properties ...... py and micro-x-ray diffraction
@en
Probing the elastic properties ...... py and micro-x-ray diffraction
@nl
P2093
P2860
P50
P356
P1476
Probing the elastic properties ...... py and micro-x-ray diffraction
@en
P2093
R. Magalhães-Paniago
T. H. Metzger
T. Scheler
T. W. Cornelius
P2860
P304
P356
10.1063/1.3067988
P407
P577
2009-01-12T00:00:00Z