about
Label-free, atomic force microscopy-based mapping of DNA intrinsic curvature for the nanoscale comparative analysis of bent duplexes.Experimental investigation of the contact mechanics of rough fractal surfaces.Symmetric curvature descriptors for label-free analysis of DNA.An automatic method for atom identification in scanning tunnelling microscopy images of Fe-chalcogenide superconductors.Giant frictional dissipation peaks and charge-density-wave slips at the NbSe2 surface.The contact mechanics of fractal surfaces.Subnanometer Resolution and Enhanced Friction Contrast at the Surface of Perylene Diimide PDI8-CN2 Thin Films in Ambient Conditions.Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO_{3} Structural Phase Transition.Optically addressable single molecule magnet behaviour of vacuum-sprayed ultrathin filmsAtomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered micaFast three-dimensional nanoscale metrology in dual-beam FIB–SEM instrumentationDeformation and Adhesion of Elastomer Poly(dimethylsiloxane) Colloidal AFM ProbesFriction laws for lubricated nanocontactsStructural Depinning of Ne Monolayers on Pb atT<6.5 KNanostructuring polymers by soft lithography templates realized via ion sputteringFabrication of stable nanopatterns on metalsFabrication and electromechanical actuation of epitaxial SrTiO3(0 0 1) microcantilevers
P50
Q30514563-BA7E9C8C-E283-495F-A998-C0AFDC565A4AQ35894837-6EE9AC7A-C79E-45B2-91EE-1F829CB945C0Q37734631-90A46BCD-3D7A-4889-ABA0-DF5516D02B9AQ40623473-263F4A2A-82EB-4C0E-9627-144D91144536Q44294888-76FAA50A-CC38-44B1-A151-8B8F8C4ADD03Q44400180-7AB64937-2723-4C37-96B1-9356B5C175E2Q51737970-AA15133C-D682-4A96-B81E-049ADBFCC1D9Q53392402-6CD90D0C-4494-487E-B8F2-9C985BAA83EAQ59424290-184400D0-2498-4C1B-B801-1439F7779753Q59844707-ED321D8B-193A-4062-A19F-EAD9D4EF5FFBQ60182437-2125BFB0-77F0-4AD0-9D6C-66B3B66C7DC8Q60182445-1527BC23-ED1B-4459-A0A6-335B634C99BDQ60182452-0ABF1139-D4CC-4EE6-AD21-300DFDED5603Q60182456-D81496D6-9559-4903-B134-83DF52BF0D99Q60182462-55321883-6DB4-4522-A4A9-83449E00DA46Q60182483-EA84858D-FD48-4C19-9868-C05B6C510CC0Q60298826-0A950D08-4967-4282-96DE-2CDDAE0D93B7
P50
description
researcher ORCID ID = 0000-0001-5632-5531
@en
wetenschapper
@nl
name
Renato Buzio
@ast
Renato Buzio
@en
Renato Buzio
@es
Renato Buzio
@nl
type
label
Renato Buzio
@ast
Renato Buzio
@en
Renato Buzio
@es
Renato Buzio
@nl
prefLabel
Renato Buzio
@ast
Renato Buzio
@en
Renato Buzio
@es
Renato Buzio
@nl
P1153
55958956100
P31
P496
0000-0001-5632-5531