about
Chemical and kinetic insights into the Thermal Decomposition of an Oxide Layer on Si(111) from Millisecond Photoelectron Spectroscopy.How a tertiary diamine molecule chelates the silicon dimers of the Si(001) surface: a real-time scanning tunneling microscopy study.Soft X-ray Heterogeneous Radiolysis of Pyridine in the Presence of Hydrated Strontium-Hydroxyhectorite and its Monitoring by Near-Ambient Pressure Photoelectron Spectroscopy.CO oxidation activity of Pt, Zn and ZnPt nanocatalysts: a comparative study by in situ near-ambient pressure X-ray photoelectron spectroscopy.
P50
description
onderzoeker
@nl
researcher ORCID ID = 0000-0001-9316-559X
@en
name
François Rochet
@ast
François Rochet
@en
François Rochet
@nl
type
label
François Rochet
@ast
François Rochet
@en
François Rochet
@nl
prefLabel
François Rochet
@ast
François Rochet
@en
François Rochet
@nl
P106
P31
P496
0000-0001-9316-559X