Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
description
im Juni 2004 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в червні 2004
@uk
name
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si
@nl
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
@en
type
label
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si
@nl
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
@en
prefLabel
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si
@nl
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
@en
P1433
P1476
Atomic force microscopy study of60−keVAr-ion-induced ripple patterns on Si(100)
@en
P2093
Tapas Kumar Chini
P356
10.1103/PHYSREVB.69.235313
P407
P577
2004-06-16T00:00:00Z