Hard x-ray nano-beam characterization by ptychographic imaging
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Hard x-ray nano-beam characterization by ptychographic imaging
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wetenschappelijk artikel
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наукова стаття, опублікована у вересні 2011
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Hard x-ray nano-beam characterization by ptychographic imaging
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Hard x-ray nano-beam characterization by ptychographic imaging
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Hard x-ray nano-beam characterization by ptychographic imaging
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Hard x-ray nano-beam characterization by ptychographic imaging
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Hard x-ray nano-beam characterization by ptychographic imaging
@en
Hard x-ray nano-beam characterization by ptychographic imaging
@nl
P2093
P356
P1476
Hard x-ray nano-beam characterization by ptychographic imaging
@en
P2093
Andreas Schropp
Andy Goldschmidt
Dirk Samberg
Frank Seiboth
Gerald Falkenberg
Gerd Wellenreuther
Jens Patommel
Manfred Burghammer
Robert Hoppe
Sandra Stephan
P356
10.1117/12.893055
P577
2011-09-08T00:00:00Z