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Q52869505-E8A2402A-C29C-4780-BAB2-2C593F257D64
Q52869505-E8A2402A-C29C-4780-BAB2-2C593F257D64
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Statement
http://www.wikidata.org/entity/statement/Q52869505-E8A2402A-C29C-4780-BAB2-2C593F257D64
Erratum to: lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards.
P2860
Q52869505-E8A2402A-C29C-4780-BAB2-2C593F257D64
BestRank
Statement
http://www.wikidata.org/entity/statement/Q52869505-E8A2402A-C29C-4780-BAB2-2C593F257D64
rank
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Statement
wasDerivedFrom
e6ff2f65edc3ee36eb601b43bae220deb18bf89d
P2860
A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: Application and performance.