X-ray reflectivity
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. It is a form of reflectometry based on the use of X-rays and is related to the techniques of neutron reflectometry and ellipsometry.
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Atomic layer depositionFedexiaFlorin AbelèsFresnel equationsGrazing incidence X-ray reflectivityIndex of physics articles (X)Ionic compoundLipid bilayerList of materials analysis methodsLyman G. ParrattMolecular layer depositionNeutron reflectometryPeter PershanReflectometryRigakuSpecular reflectionStanding waveSurface layeringSurface scienceSurfactantSynchrotron light sourceTransfer-matrix method (optics)X-rayX-ray opticsX-ray reflectometryX-ray scattering techniquesX-ray standing wavesXRR
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X-ray reflectivity
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. It is a form of reflectometry based on the use of X-rays and is related to the techniques of neutron reflectometry and ellipsometry.
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Die Röntgenreflektometrie (eng ...... magnetischer Strahlung nutzen.
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Reflektivitas sinar-X (kadang- ...... mlah puncak sebagai berikut: .
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Refletividade de raios X, algu ...... dades, por exemplo, usando o .
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X-ray reflectivity (sometimes ...... terface normal to the surface.
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Die Röntgenreflektometrie (eng ...... magnetischer Strahlung nutzen.
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Reflektivitas sinar-X (kadang- ...... pangan baku (aka kekasaran). .
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Refletividade de raios X, algu ...... interface normal à superfície.
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X-ray reflectivity (sometimes ...... eflectometry and ellipsometry.
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Reflektivitas sinar-X
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Refletividade de raios X
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Röntgenreflektometrie
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X-ray reflectivity
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