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C1NR10104H
C1NR10104H
http://dx.doi.org/10.1039/C1NR10104H
Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy.
P356
Q51009666-909412BC-0CD4-4060-AA55-6347254C7EB1
P356
C1NR10104H
http://dx.doi.org/10.1039/C1NR10104H