Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy.
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Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy.
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2011 nî lūn-bûn
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Lateral redistribution of trap ...... lectrostatic force microscopy.
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Lateral redistribution of trapped charges in nitride/oxide/Si
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type
label
Lateral redistribution of trap ...... lectrostatic force microscopy.
@en
Lateral redistribution of trapped charges in nitride/oxide/Si
@nl
prefLabel
Lateral redistribution of trap ...... lectrostatic force microscopy.
@en
Lateral redistribution of trapped charges in nitride/oxide/Si
@nl
P2093
P2860
P356
P1433
P1476
Lateral redistribution of trap ...... lectrostatic force microscopy.
@en
P2093
Hyunjun Yoo
Hyunjung Shin
Jang-Sik Lee
Koeng Su Lim
Seung Jae Baik
Wonsup Choi
P2860
P304
P356
10.1039/C1NR10104H
P407
P577
2011-05-09T00:00:00Z