Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique.
about
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surfaceCombined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications.Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature.Nano-contact microscopy of supracrystals.Optimal geometry for a quartz multipurpose SPM sensor.Characterization of the mechanical properties of qPlus sensors.Force-induced tautomerization in a single molecule.Prototypical Organic-Oxide Interface: Intramolecular Resolution of Sexiphenyl on In2O3(111).Measuring the reactivity of a silicon-terminated probeIntramolecular bonds resolved on a semiconductor surfaceAttempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy
P2860
Q30839177-EBE47CA5-F9CA-4EFC-8BBF-D8B7875D8E28Q38925462-3CC2C93C-2CFB-43D3-88D4-77A1C18A82A3Q38969196-A9424EB6-B767-41D4-8A86-7240ABE9A210Q40264912-526C7B27-C1EF-4959-9ADD-1A4E78F1DB55Q41878938-D33DAA90-612F-4E3C-A88C-45C0B51ACE75Q42230952-0BF90E39-9CC3-49C6-BE33-BAEA33BD6DF2Q43202518-42EFFC90-CAD6-4014-A8ED-76619707BF9FQ48054492-908560D4-1DC3-4D12-8EBC-B5C7A8D2C296Q52626141-2401A566-1552-4275-B6FD-90ECF4816EFBQ58086629-05FB4F00-09AF-4E7A-9061-376DBCE242C8Q58086783-C6755B11-82CB-46FD-A263-01F091F66BFBQ58906955-142B2445-9333-4D81-83CD-3055E7790FF1
P2860
Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique.
description
2012 nî lūn-bûn
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2012 թուականի Մարտին հրատարակուած գիտական յօդուած
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2012 թվականի մարտին հրատարակված գիտական հոդված
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2012年の論文
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2012年論文
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2012年論文
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2012年論文
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2012年論文
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2012年論文
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2012年论文
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name
Simultaneous current, force an ...... imized qPlus AFM/STM technique
@nl
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@ast
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@en
type
label
Simultaneous current, force an ...... imized qPlus AFM/STM technique
@nl
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@ast
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@en
prefLabel
Simultaneous current, force an ...... imized qPlus AFM/STM technique
@nl
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@ast
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@en
P2093
P2860
P356
P1476
Simultaneous current, force an ...... mized qPlus AFM/STM technique.
@en
P2093
Albrecht Feltz
Andreas Bettac
Martin Setvín
Pavel Jelínek
Vladimír Cháb
Zsolt Majzik
P2860
P304
P356
10.3762/BJNANO.3.28
P407
P577
2012-03-15T00:00:00Z