Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

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http://www.wikidata.org/entity/Q27335778
Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique.Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atomsMapping the electrostatic force field of single molecules from high-resolution scanning probe imagesIndications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surfaceCombined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications.Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature.Dynamic tunneling force microscopy for characterizing electronic trap states in non-conductive surfaces.Nano-contact microscopy of supracrystals.Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsMultiscale approach for simulations of Kelvin probe force microscopy with atomic resolutionIntramolecular bonds resolved on a semiconductor surfaceIdentifying passivated dynamic force microscopy tips on H:Si(100)
P2860

Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

Item
http://www.wikidata.org/entity/Q27335778
description
2011 nî lūn-bûn
@nan
2011 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@ast
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@en
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@nl
type
label
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@ast
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@en
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@nl
prefLabel
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@ast
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@en
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@nl
P1433
P1476
P2093
P2860
P31
P3181
P356
P407
P433
P478
P577
P698
P818
P3181
P356
P1433
P1476
Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
@en
P2093
P2860
P31
P3181
P356
10.1103/PHYSREVLETT.106.226801
P407
P433
P478
P577
P698
P818