Removing drift from scanning probe microscope images of periodic samples
about
Optimizing single DNA molecules manipulation by AFM.Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy.Ultrastable atomic force microscopy: improved force and positional stability.Effects of temperature and humidity on atomic force microscopy dimensional measurement.Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges.Application of a novel nonperiodic grating in scanning probe microscopy drift measurement.
P2860
Removing drift from scanning probe microscope images of periodic samples
description
1998 nî lūn-bûn
@nan
1998 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
1998 թվականի հունվարին հրատարակված գիտական հոդված
@hy
1998年の論文
@ja
1998年論文
@yue
1998年論文
@zh-hant
1998年論文
@zh-hk
1998年論文
@zh-mo
1998年論文
@zh-tw
1998年论文
@wuu
name
Removing drift from scanning probe microscope images of periodic samples
@ast
Removing drift from scanning probe microscope images of periodic samples
@en
type
label
Removing drift from scanning probe microscope images of periodic samples
@ast
Removing drift from scanning probe microscope images of periodic samples
@en
prefLabel
Removing drift from scanning probe microscope images of periodic samples
@ast
Removing drift from scanning probe microscope images of periodic samples
@en
P356
P1476
Removing drift from scanning probe microscope images of periodic samples
@en
P2093
John T. Woodward
P356
10.1116/1.589834
P577
1998-01-01T00:00:00Z