Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges.
about
A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.Atomic force microscopy with a 12-electrode piezoelectric tube scanner.Study of sensitivity and noise in the piezoelectric self-sensing and self-actuating cantilever with an integrated Wheatstone bridge circuit.Logarithmic based optical delay for time-resolved data collection.Quantitative scanning probe microscope topographies by charge linearization of the vertical actuator.An alternative flat scanner and micropositioning method for scanning probe microscope.Atomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator.Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001).High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues.Switched capacitor charge pump used for low-distortion imaging in atomic force microscope.High-fidelity AFM scanning stage based on multilayer ceramic capacitors.Stabilizing nanometer scale tip-to-substrate gaps in scanning electrochemical microscopy using an isothermal chamber for thermal drift suppression.Real-space post-processing correction of thermal drift and piezoelectric actuator nonlinearities in scanning tunneling microscope images.Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionElectrochemical Sensing and Imaging Based on Ion Transfer at Liquid/Liquid Interfaces.Removing material using atomic force microscopy with single- and multiple-tip sources.Indentation-formed nanocontacts: an atomic-scale perspective.Fast and robust control of nanopositioning systems: Performance limits enabled by field programmable analog arrays.Ultra-precision measurement and control of angle motion in piezo-based platforms using strain gauge sensors and a robust composite controller.Robust atomic force microscopy using multiple sensors.Observation of dynamical heterogeneities and their time evolution on the surface of an amorphous polymer.Butterworth Pattern-based Simultaneous Damping and Tracking Controller Designs for Nanopositioning SystemsFinite-Time Terminal Sliding Mode Tracking Control for Piezoelectric ActuatorsAdaptive PI-Based Sliding Mode Control for Nanopositioning of Piezoelectric Actuators
P2860
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P2860
Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges.
description
article científic
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article scientifique
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articolo scientifico
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artigo científico
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bilimsel makale
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scientific article published on July 2008
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vedecký článok
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vetenskaplig artikel
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videnskabelig artikel
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vědecký článek
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name
Invited review article: accura ...... trends and future challenges.
@en
Invited review article: accura ...... trends and future challenges.
@nl
type
label
Invited review article: accura ...... trends and future challenges.
@en
Invited review article: accura ...... trends and future challenges.
@nl
prefLabel
Invited review article: accura ...... trends and future challenges.
@en
Invited review article: accura ...... trends and future challenges.
@nl
P2860
P356
P1476
Invited review article: accura ...... trends and future challenges.
@en
P2093
S O Reza Moheimani
P2860
P304
P356
10.1063/1.2957649
P407
P577
2008-07-01T00:00:00Z