Power spectrum analysis with least-squares fitting: amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers.
about
An improved optical tweezers assay for measuring the force generation of single kinesin molecules.A simple method for evaluating the trapping performance of acoustic tweezers.'Dicty dynamics': Dictyostelium motility as persistent random motion.Harmonic force spectroscopy measures load-dependent kinetics of individual human β-cardiac myosin moleculesAn endosomal tether undergoes an entropic collapse to bring vesicles together.Measurement of probe displacement to the thermal resolution limit in photonic force microscopy using a miniature quadrant photodetector.Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope.Extending the range for force calibration in magnetic tweezersHow to connect time-lapse recorded trajectories of motile microorganisms with dynamical models in continuous time.How to Measure Load-Dependent Kinetics of Individual Motor Molecules Without a Force-Clamp.Magnetic tweezers force calibration for molecules that exhibit conformational switching.Power spectrum and Allan variance methods for calibrating single-molecule video-tracking instruments.The Mitotic Spindle in the One-Cell C. elegans Embryo Is Positioned with High Precision and StabilityAuto- and cross-power spectral analysis of dual trap optical tweezer experiments using Bayesian inference.Acoustic force spectroscopy.Single-Molecule Measurements Using Acoustic Force Spectroscopy (AFS).Using Brownian motion to measure shape asymmetry in mesoscopic matter using optical tweezers.Inertial effects of a small Brownian particle cause a colored power spectral density of thermal noise.Daniell method for power spectral density estimation in atomic force microscopy.Optimal estimation of diffusion coefficients from single-particle trajectories.
P2860
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P2860
Power spectrum analysis with least-squares fitting: amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers.
description
2010 nî lūn-bûn
@nan
2010 թուականի Յուլիսին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի հուլիսին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Power spectrum analysis with l ...... force microscope cantilevers.
@ast
Power spectrum analysis with l ...... force microscope cantilevers.
@en
type
label
Power spectrum analysis with l ...... force microscope cantilevers.
@ast
Power spectrum analysis with l ...... force microscope cantilevers.
@en
prefLabel
Power spectrum analysis with l ...... force microscope cantilevers.
@ast
Power spectrum analysis with l ...... force microscope cantilevers.
@en
P2860
P356
P1476
Power spectrum analysis with l ...... force microscope cantilevers.
@en
P2860
P304
P356
10.1063/1.3455217
P407
P577
2010-07-01T00:00:00Z