Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope.
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Spring constant calibration of atomic force microscope cantilevers of arbitrary shape.Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope.Daniell method for power spectral density estimation in atomic force microscopy.Myotube elasticity of an amyotrophic lateral sclerosis mouse model.Design strategies for controlling damping in micromechanical and nanomechanical resonatorsDesign strategies for controlling damping in micromechanical and nanomechanical resonators
P2860
Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope.
description
2012 nî lūn-bûn
@nan
2012 թուականի Մայիսին հրատարակուած գիտական յօդուած
@hyw
2012 թվականի մայիսին հրատարակված գիտական հոդված
@hy
2012年の論文
@ja
2012年論文
@yue
2012年論文
@zh-hant
2012年論文
@zh-hk
2012年論文
@zh-mo
2012年論文
@zh-tw
2012年论文
@wuu
name
Effect of multiplicative noise ...... o the atomic force microscope.
@ast
Effect of multiplicative noise ...... o the atomic force microscope.
@en
Effect of multiplicative noise ...... o the atomic force microscope.
@nl
type
label
Effect of multiplicative noise ...... o the atomic force microscope.
@ast
Effect of multiplicative noise ...... o the atomic force microscope.
@en
Effect of multiplicative noise ...... o the atomic force microscope.
@nl
prefLabel
Effect of multiplicative noise ...... o the atomic force microscope.
@ast
Effect of multiplicative noise ...... o the atomic force microscope.
@en
Effect of multiplicative noise ...... o the atomic force microscope.
@nl
P2860
P356
P1476
Effect of multiplicative noise ...... to the atomic force microscope
@en
P2093
John E Sader
Julian A Sanelli
P2860
P304
P356
10.1063/1.4709496
P407
P577
2012-05-01T00:00:00Z