Invited review article: A 10 mK scanning probe microscopy facility.
about
Critical assessment of the evidence for striped nanoparticlesCompact scanning tunneling microscope for spin polarization measurements.A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device.Compact very low temperature scanning tunneling microscope with mechanically driven horizontal linear positioning stage.A modular designed ultra-high-vacuum spin-polarized scanning tunneling microscope with controllable magnetic fields for investigating epitaxial thin films.A compact sub-Kelvin ultrahigh vacuum scanning tunneling microscope with high energy resolution and high stability.A scanning tunneling microscope with a scanning range from hundreds of micrometers down to nanometer resolution.Construction and performance of a dilution-refrigerator based spectroscopic-imaging scanning tunneling microscope.Design of a scanning gate microscope for mesoscopic electron systems in a cryogen-free dilution refrigerator.A 10 mK scanning tunneling microscope operating in ultra high vacuum and high magnetic fields.Current-voltage characterization of individual as-grown nanowires using a scanning tunneling microscopeDesign and performance of an ultra-high vacuum scanning tunneling microscope operating at dilution refrigerator temperatures and high magnetic fields.A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability.Facility for low-temperature spin-polarized-scanning tunneling microscopy studies of magnetic/spintronic materials prepared in situ by nitride molecular beam epitaxy.A 30 mK, 13.5 T scanning tunneling microscope with two independent tips.A cryogen-free low temperature scanning tunneling microscope capable of inelastic electron tunneling spectroscopy.Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage.Scanning Tunneling Spectroscopy of Proximity Superconductivity in Epitaxial Multilayer Graphene.Indentation-formed nanocontacts: an atomic-scale perspective.The structure and function of cell membranes examined by atomic force microscopy and single-molecule force spectroscopy.A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures.Reinterpretation of velocity-dependent atomic friction: influence of the inherent instrumental noise in friction force microscopes.Systematic analyses of vibration noise of a vibration isolation system for high-resolution scanning tunneling microscopes.A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals.An ultrahigh-vacuum cryostat for simultaneous scanning tunneling microscopy and magneto-transport measurements down to 400 mK.A low-temperature scanning tunneling microscope capable of microscopy and spectroscopy in a Bitter magnet at up to 34 T.Versatile variable temperature and magnetic field scanning probe microscope for advanced material research.Low vibration laboratory with a single-stage vibration isolation for microscopy applications.Upgrade of a commercial four-probe scanning tunneling microscopy system.Experimental evidence for s-wave pairing symmetry in superconducting Cu(x)Bi2Se3 single crystals using a scanning tunneling microscope.Acoustic buffeting by infrasound in a low vibration facility.Atomic resolution scanning tunneling microscopy in a cryogen free dilution refrigerator at 15 mK
P2860
Q28544982-5AA8D4CD-4926-4D92-808B-B09886102064Q30423227-8D93C462-9C00-46A9-8986-26C118DEA715Q31109869-F4B06391-DB46-4F49-B42E-BDB1A6CA0BB5Q33859999-87839BDD-4C00-4EEA-B05C-BDEA9F9D9B74Q33922045-0F929FA9-A34D-467B-BF2D-302E72FD7652Q34065221-0C58732B-0BFB-4C64-BC94-A0C3A100FFB1Q34467028-810CDB21-DB8B-4999-AFDF-CCD0A0A05A89Q34578519-6C34B70E-4459-4430-BE41-F67B048990F5Q34654774-BE9DF8E4-5FC7-4EE5-BDAE-E77A20456DFFQ34654783-950E4E68-729F-4ECC-AD8B-EFB41CEDC767Q34995410-3AB77B76-96CE-42DD-B30D-1ADE5CCDD0DCQ35030525-A5278A60-682A-4648-844A-C5766937B660Q35056583-E7CBADEB-98D2-4ADA-ACDD-E2F6C3724A9BQ35160446-7D98C1ED-2DAF-4868-A473-626F12D1EB10Q35160451-40F163C0-A8CF-4EBD-8045-340E478A3C51Q36066465-B2A71589-6E9E-4CCC-A5DA-FA628678D456Q36358886-8F1A4438-2F78-45D2-B373-7B7AF5C60E1CQ36800264-A4F7B82B-4FE9-4E27-A518-9906F59BB22EQ38199948-EAC5383A-9EBD-444B-878D-43EE301E76F2Q38429670-D4C6559A-8C76-4567-B4AE-C29BC8907013Q38706255-F8EDC11B-A3BF-454A-BCBC-214F4FE46972Q46847983-148AE0E6-23F4-403B-AA25-6F5E3903BE09Q46929002-AC0CD10B-4C36-4B8E-BB1F-45B6DFA32826Q47222830-BBDC89AE-C784-49D9-8BDA-0861DBBF0CF2Q47230746-23760A4C-2E00-4A99-A970-C9DAE9801317Q47862824-6BB0B6AD-25AC-4746-8BD4-666784EE865BQ48050141-F6C754A0-2FC8-4CA2-A91E-9A1517B1024DQ48177777-0AF4EB35-0109-4773-BD8F-DFA10AE51318Q48190115-E74836FC-8FE4-48DC-8596-56DA62061838Q53152876-C9081EEA-8728-4EDC-9CAA-BFBEF8508AEFQ54325331-D5C8B80F-7527-4539-A9C8-BB88FF615D34Q57183463-F637A279-99FC-4011-878C-9AD73AE38040
P2860
Invited review article: A 10 mK scanning probe microscopy facility.
description
2010 nî lūn-bûn
@nan
2010 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Invited review article: A 10 mK scanning probe microscopy facility.
@ast
Invited review article: A 10 mK scanning probe microscopy facility.
@en
type
label
Invited review article: A 10 mK scanning probe microscopy facility.
@ast
Invited review article: A 10 mK scanning probe microscopy facility.
@en
prefLabel
Invited review article: A 10 mK scanning probe microscopy facility.
@ast
Invited review article: A 10 mK scanning probe microscopy facility.
@en
P2093
P2860
P356
P1476
Invited review article: A 10 mK scanning probe microscopy facility
@en
P2093
Frank M Hess
Joseph A Stroscio
Steven R Blankenship
Vladimir Shvarts
Young Jae Song
P2860
P304
P356
10.1063/1.3520482
P407
P50
P577
2010-12-01T00:00:00Z