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Noncontact atomic force microscopy simulator with phase-locked-loop controlled frequency detection and excitationProbing the shape of atoms in real spaceAdvances in atomic force microscopyStiffness of sphere-plate contacts at MHz frequencies: dependence on normal load, oscillation amplitude, and ambient medium.Angled long tip to tuning fork probes for atomic force microscopy in various environments.Quantifying molecular stiffness and interaction with lateral force microscopy.The registry index: a quantitative measure of materials' interfacial commensurability.Optimal geometry for a quartz multipurpose SPM sensor.Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.Interpreting motion and force for narrow-band intermodulation atomic force microscopy.Angle dependence of the interaction distance in the shear force technique.Vectorial scanning force microscopy using a nanowire sensor.Complex design of dissipation signals in non-contact atomic force microscopy.Single atomic contact adhesion and dissipation in dynamic force microscopy.A depletion layer in polymer solutions at an interface oscillating at the subnano- to submicrometer scale.Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsUltrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurementsNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesAtomic Structure Affects the Directional Dependence of Friction
P2860
Q21708411-A04C3312-76B1-4755-AC82-C04B46E166C8Q21708450-63308D0F-0F00-467C-8FE9-9473A546B61EQ27349251-CA0FF2C4-94B7-45B3-B7F6-77D2EB4EFEE1Q30411984-6207F328-F06E-494D-996B-3A5360715731Q33884593-765F3F88-3A17-4924-A0BC-A0E064234880Q34402991-6104F968-9BDC-4A7C-B57B-CE4C58E352B2Q38115490-A118B040-6C7D-48C5-98B1-372737D840B3Q42230952-0E435970-45B4-49E3-A961-65EFF3D6B787Q42550311-42281067-080F-41C2-AA54-DFB69C6B96F9Q43202444-A45C81C7-3062-418F-8B89-11EED26C5D0DQ43603570-8608AB11-68F4-4514-8B3B-6E31F0EDB8F1Q48053550-8D0BFD75-ACA9-461A-8092-83985F907943Q49056239-F511CE98-0DF9-443A-9015-74D8F6BCA685Q51228745-36AD7E04-FBFC-4CBD-9A7C-A0D233268EB9Q53468825-57519825-61FD-4617-B408-5B104517B6F8Q56962110-C8EFFE66-F490-4FD9-A2E5-7647F5BEEF4AQ57739351-60728596-49B2-4933-96C2-87828A6E5F06Q59001855-EFD9E672-FD68-4575-A46C-BFB2A0BE5CCDQ59309841-F0E1E919-B84C-4890-9564-04C71C3F33E6
P2860
description
2002 nî lūn-bûn
@nan
2002 թուականի Օգոստոսին հրատարակուած գիտական յօդուած
@hyw
2002 թվականի օգոստոսին հրատարակված գիտական հոդված
@hy
2002年の論文
@ja
2002年論文
@yue
2002年論文
@zh-hant
2002年論文
@zh-hk
2002年論文
@zh-mo
2002年論文
@zh-tw
2002年论文
@wuu
name
Friction traced to the single atom
@ast
Friction traced to the single atom
@en
Friction traced to the single atom
@nl
type
label
Friction traced to the single atom
@ast
Friction traced to the single atom
@en
Friction traced to the single atom
@nl
prefLabel
Friction traced to the single atom
@ast
Friction traced to the single atom
@en
Friction traced to the single atom
@nl
P2860
P356
P1476
Friction traced to the single atom
@en
P2093
Markus Herz
P2860
P304
12006-12010
P356
10.1073/PNAS.182160599
P407
P577
2002-08-27T00:00:00Z