Lateral-force measurements in dynamic force microscopy

Lateral-force measurements in dynamic force microscopy

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http://www.wikidata.org/entity/Q58642530
Advances in atomic force microscopyFerrule-top atomic force microscope.Angled long tip to tuning fork probes for atomic force microscopy in various environments.Friction traced to the single atomQuantifying molecular stiffness and interaction with lateral force microscopy.Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Vectorial scanning force microscopy using a nanowire sensor.Energy Loss Triggered by Atomic-Scale Lateral ForceUltrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurementsDouble quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopyQuantitative extraction of in-plane surface properties using torsional resonance mode of atomic force microscopyAtomic Structure Affects the Directional Dependence of Friction
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Lateral-force measurements in dynamic force microscopy

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http://www.wikidata.org/entity/Q58642530
description
im April 2002 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована у квітні 2002
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name
Lateral-force measurements in dynamic force microscopy
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Lateral-force measurements in dynamic force microscopy
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type
label
Lateral-force measurements in dynamic force microscopy
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Lateral-force measurements in dynamic force microscopy
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prefLabel
Lateral-force measurements in dynamic force microscopy
@en
Lateral-force measurements in dynamic force microscopy
@nl
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Lateral-force measurements in dynamic force microscopy
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P2860
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10.1103/PHYSREVB.65.161403
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