The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.
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Low-Coherence Interferometric Fiber-Optic Sensors with Potential Applications as Biosensors.Structural Properties Characterized by the Film Thickness and Annealing Temperature for La2O3 Films Grown by Atomic Layer Deposition.Optical Constants and Band Gap Evolution with Phase Transition in Sub-20-nm-Thick TiO2 Films Prepared by ALD.The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry.Optical Properties of Al-Doped ZnO Films in the Infrared Region and Their Absorption Applications.
P2860
The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.
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2015 nî lūn-bûn
@nan
2015 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2015 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
name
The impact of thickness and th ...... ed by atomic layer deposition.
@ast
The impact of thickness and th ...... ed by atomic layer deposition.
@en
type
label
The impact of thickness and th ...... ed by atomic layer deposition.
@ast
The impact of thickness and th ...... ed by atomic layer deposition.
@en
prefLabel
The impact of thickness and th ...... ed by atomic layer deposition.
@ast
The impact of thickness and th ...... ed by atomic layer deposition.
@en
P2093
P2860
P921
P1476
The impact of thickness and th ...... ed by atomic layer deposition.
@en
P2093
Hong-Liang Lu
Ji-Ping Xu
Liang-Yao Chen
Rong-Jun Zhang
Song-You Wang
Yan-Feng Wei
Zi-Yi Wang
P2860
P2888
P356
10.1186/S11671-015-0757-Y
P577
2015-02-06T00:00:00Z
P5875
P6179
1020451934