High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

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High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

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2015 nî lūn-bûn

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2015年の論文

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2015年論文

@yue

2015年論文

@zh-hant

2015年論文

@zh-hk

2015年論文

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High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

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High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

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Item

label

High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

@ast

High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

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High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

@ast

High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

@en

P1476

High-fidelity AFM scanning stage based on multilayer ceramic capacitors.

@en

P2093

Jian Chen

http://www.w3.org/2001/XMLSchema#string

Lian Sheng Zhang

http://www.w3.org/2001/XMLSchema#string

Zhi Hua Feng

http://www.w3.org/2001/XMLSchema#string

P2860

Atomic force microscope

Charge drives for scanning probe microscope positioning stages.

Making a commercial atomic force microscope more accurate and faster using positive position feedback control.

Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges.

Scanning Probe Microscopy

P304

184-190

http://www.w3.org/2001/XMLSchema#string

P31

scholarly article

P356

10.1002/SCA.21253

http://www.w3.org/2001/XMLSchema#string

P433

http://www.w3.org/2001/XMLSchema#string

P478

http://www.w3.org/2001/XMLSchema#string

P577

2015-09-14T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

26367125

http://www.w3.org/2001/XMLSchema#string