EELS log-ratio technique for specimen-thickness measurement in the TEM.
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Direct in situ determination of the mechanisms controlling nanoparticle nucleation and growth.Ultrafine particles in human lung macrophages.Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel.X-ray mapping in electron-beam instruments.Self-aligned wet-cell for hydrated microbiology observation in TEM.Atomic-scale imaging and spectroscopy for in situ liquid scanning transmission electron microscopy.Visualization of clusters in polymer electrolyte membranes by electron microscopy.A Fast and Effective Microfluidic Spraying-Plunging Method for High-Resolution Single-Particle Cryo-EM.Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope.Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltage.X-ray energy-dispersive spectrometry during in situ liquid cell studies using an analytical electron microscope.Study of inelastic mean free path of metal nanostructures using energy filtered transmission electron microscopy imaging.Quantitative analysis of magnetic spin and orbital moments from an oxidized iron (1 1 0) surface using electron magnetic circular dichroism.Simultaneous determination of sample thickness, tilt, and electron mean free path using tomographic tilt images based on Beer-Lambert law.A fast cross-validation method for alignment of electron tomography images based on Beer-Lambert law.Sea Spray Aerosol Structure and Composition Using Cryogenic Transmission Electron Microscopy.Real-space localization and quantification of hole distribution in chain-ladder Sr3Ca11Cu24O41 superconductorEnergy filtered electron tomography of ice-embedded actin and vesiclesMigration mechanism of a GaN bicrystalline grain boundary as a model system.Local band gap measurements by VEELS of thin film solar cells.Antibody-Based Affinity Cryoelectron Microscopy at 2.6-Å Resolution.Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach.Controlled self-assembly of biomolecular rods on structured substrates.Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging.Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques.Crack tip shielding observed with high-resolution transmission electron microscopy.Structural variability and complexity of the giant Pithovirus sibericum particle revealed by high-voltage electron cryo-tomography and energy-filtered electron cryo-microscopyAtomic Configuration of Point Defect Clusters in Ion-Irradiated Silicon Carbide.In-situ atomic-scale observation of irradiation-induced void formation.Real-space analysis of diffusion behavior and activation energy of individual monatomic ions in a liquid.The role of the interface in germanium quantum dots: when not only size matters for quantum confinement effects.Nanometer Resolution Elemental Mapping in Graphene-Based TEM Liquid Cells.Liquid like nucleation in free-standing nanoscale films.What remains to be done to allow quantitative X-ray microanalysis performed with EDS to become a true characterization technique?Correlation between Local Structure Order and Spatial Heterogeneity in a Metallic Glass.An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field.Thickness difference: a new filtering tool for quantitative electron diffraction.Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device.Reductive exfoliation of substoichiometric MoS2 bilayers using hydrazine salts.A Novel Lubricant Based on Covalent Functionalized Graphene Oxide Quantum Dots.
P2860
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P2860
EELS log-ratio technique for specimen-thickness measurement in the TEM.
description
1988 nî lūn-bûn
@nan
1988年の論文
@ja
1988年学术文章
@wuu
1988年学术文章
@zh-cn
1988年学术文章
@zh-hans
1988年学术文章
@zh-my
1988年学术文章
@zh-sg
1988年學術文章
@yue
1988年學術文章
@zh
1988年學術文章
@zh-hant
name
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@ast
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@en
type
label
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@ast
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@en
prefLabel
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@ast
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@en
P2093
P356
P1476
EELS log-ratio technique for specimen-thickness measurement in the TEM.
@en
P2093
P304
P356
10.1002/JEMT.1060080206
P577
1988-02-01T00:00:00Z