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Q36442526-A1774853-1647-4386-8B43-E0C0F3129416
Q36442526-A1774853-1647-4386-8B43-E0C0F3129416
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http://www.wikidata.org/entity/statement/Q36442526-A1774853-1647-4386-8B43-E0C0F3129416
EELS log-ratio technique for specimen-thickness measurement in the TEM.
P1433
Q36442526-A1774853-1647-4386-8B43-E0C0F3129416
BestRank
Statement
http://www.wikidata.org/entity/statement/Q36442526-A1774853-1647-4386-8B43-E0C0F3129416
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ee7134a8381919044859e4470df49b3e2b2aea72
P1433
Journal of electron microscopy technique