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Viscoelastic properties of collagen: synchrotron radiation investigations and structural modelIn-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation.X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparisonCombinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellaeLateral gradients of phases, residual stress and hardness in a laser heated Ti0.52Al0.48N coating on hard metal.Ab initio molecular dynamics model for density, elastic properties and short range order of Co-Fe-Ta-B metallic glass thin films.Quantum mechanically guided design of Co43Fe20Ta(5.5)X(31.5) (X=B, Si, P, S) metallic glasses.Synergy of multi-scale toughening and protective mechanisms at hierarchical branch-stem interfaces.High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method.Elastic constants of fibre-textured thin films determined by X-ray diffraction.Complementary ab initio and X-ray nanodiffraction studies of Ta2O5.X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon viaA new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device.Cellulose nanofibrils as filler for adhesives: effect on specific fracture energy of solid wood-adhesive bonds.Cellulose in never-dried gel oriented by an AC electric field.Changes in the molecular orientation and tensile properties of uniaxially drawn cellulose films.Cell-wall recovery after irreversible deformation of wood.Effect of growth conditions on interface stability and thermophysical properties of sputtered Cu films on Si with and without WTi barrier layersMethodology for studying strain inhomogeneities in polycrystalline thin films duringin situthermal loading using coherent x-ray diffractionStructure, Stresses and Stress Relaxation of TiN/Ag Nanocomposite FilmsReview: current international research into cellulose nanofibres and nanocompositesInterface study of a high-performance W/B4C X-ray mirrorKinetics of Nanoparticle Reassembly Mediated by UV-Photolysis of SurfactantMeasurement of nanopatterned surfaces by real and reciprocal space techniquesModified Langmuir-Blodgett deposition of nanoparticles - measurement of 2D to 3D ordered arraysTowards strain gauges based on a self-assembled nanoparticle monolayer—SAXS studyCharacterization of Mo/Si soft X-ray multilayer mirrors by grazing-incidence small-angle X-ray scatteringReal-time tracking of nanoparticle self-assembling using GISAXSNano-machining for advanced X-ray crystal opticsTiO2(100)/Al2O3(0001) interface: A first-principles study supported by experimentActual versus apparent within cell wall variability of nanoindentation results from wood cell walls related to cellulose microfibril angleFracture of poly(vinylidene fluoride): a combined synchrotron and laboratory in-situ X-ray scattering studyEvaluation of experimental stress–strain dependence in thermally cycled Al thin film on Si(100)Thermally-induced stresses in thin aluminum layers grown on siliconA heating stage up to 1173 K for X-ray diffraction studies in the whole orientation spaceEvaluation of thermal and growth stresses in heteroepitaxial AlN thin films formed on (0001) sapphire by pulsed laser ablationTwinning effects in polycrystalline hexaphenyl thin filmsPreferred Orientation of Copper Phthalocyanine Thin Films Evaporated on Amorphous SubstratesStructural properties of hexaphenyl thin films obtained by a rubbing technique: characterization of a biaxial textureMacroscopic elastic properties of textured ZrN-AlN polycrystalline aggregates: Fromab initiocalculations to grain-scale interactions
P50
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P50
description
hulumtues
@sq
onderzoeker
@nl
researcher
@en
հետազոտող
@hy
name
Jozef Keckes
@ast
Jozef Keckes
@en
Jozef Keckes
@es
Jozef Keckes
@nl
Jozef Keckes
@sl
type
label
Jozef Keckes
@ast
Jozef Keckes
@en
Jozef Keckes
@es
Jozef Keckes
@nl
Jozef Keckes
@sl
prefLabel
Jozef Keckes
@ast
Jozef Keckes
@en
Jozef Keckes
@es
Jozef Keckes
@nl
Jozef Keckes
@sl
P106
P1153
7004076880
P21
P31
P496
0000-0003-4770-4331