'Illusional' nano-size effect due to artifacts of in-plane conductivity measurements of ultra-thin films.
about
Coherency strain and its effect on ionic conductivity and diffusion in solid electrolytes--an improved model for nanocrystalline thin films and a review of experimental data.The relevance of interfaces for oxide ion transport in yttria stabilized zirconia (YSZ) thin films.Oxygen tracer diffusion along interfaces of strained Y2O3/YSZ multilayers.Experimental evidence of tunable space-charge-layer-induced electrical properties of nanocrystalline ceria thin films.18O-tracer diffusion along nanoscaled Sc2O3/yttria stabilized zirconia (YSZ) multilayers: on the influence of strainThe effects of lattice strain, dislocations, and microstructure on the transport properties of YSZ films.
P2860
'Illusional' nano-size effect due to artifacts of in-plane conductivity measurements of ultra-thin films.
description
2011 nî lūn-bûn
@nan
2011年の論文
@ja
2011年学术文章
@wuu
2011年学术文章
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2011年学术文章
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2011年学术文章
@zh-hans
2011年学术文章
@zh-my
2011年学术文章
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2011年學術文章
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2011年學術文章
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name
'Illusional' nano-size effect ...... surements of ultra-thin films.
@en
'Illusional' nano-size effect ...... surements of ultra-thin films.
@nl
type
label
'Illusional' nano-size effect ...... surements of ultra-thin films.
@en
'Illusional' nano-size effect ...... surements of ultra-thin films.
@nl
prefLabel
'Illusional' nano-size effect ...... surements of ultra-thin films.
@en
'Illusional' nano-size effect ...... surements of ultra-thin films.
@nl
P2093
P356
P1476
'Illusional' nano-size effect ...... asurements of ultra-thin films
@en
P2093
Hae-Ryoung Kim
Hae-Weon Lee
Jong-Cheol Kim
Jong-Ho Lee
Kyung-Ryul Lee
P2860
P304
P356
10.1039/C0CP02673E
P407
P50
P577
2011-02-24T00:00:00Z