The effects of lattice strain, dislocations, and microstructure on the transport properties of YSZ films.

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The effects of lattice strain, dislocations, and microstructure on the transport properties of YSZ films.

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2017 nî lūn-bûn

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2017年の論文

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2017年学术文章

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2017年学术文章

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2017年学术文章

@zh-cn

2017年学术文章

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2017年学术文章

@zh-my

2017年学术文章

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2017年學術文章

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2017年學術文章

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The effects of lattice strain, ...... sport properties of YSZ films.

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The effects of lattice strain, ...... sport properties of YSZ films.

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Item

label

The effects of lattice strain, ...... sport properties of YSZ films.

@en

The effects of lattice strain, ...... sport properties of YSZ films.

@nl

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The effects of lattice strain, ...... sport properties of YSZ films.

@en

The effects of lattice strain, ...... sport properties of YSZ films.

@nl

P1476

The effects of lattice strain, ...... sport properties of YSZ films.

@en

P2093

Andrea Cavallaro

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David W McComb

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George F Harrington

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Stephen J Skinner

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P2860

Colossal ionic conductivity at interfaces of epitaxial ZrO2:Y2O3/SrTiO3 heterostructures

Influence of interface structure on mass transport in phase boundaries between different ionic materials: Experimental studies and formal considerations.

Coherency strain and its effect on ionic conductivity and diffusion in solid electrolytes--an improved model for nanocrystalline thin films and a review of experimental data.

Ionic conductivity and activation energy for oxygen ion transport in superlattices--the semicoherent multilayer system YSZ (ZrO2 + 9.5 mol% Y2O3)/Y2O3.

On the influence of strain on ion transport: microstructure and ionic conductivity of nanoscale YSZ|Sc2O3 multilayers.

Tensile lattice distortion does not affect oxygen transport in yttria-stabilized zirconia-CeO2 heterointerfaces.

The relevance of interfaces for oxide ion transport in yttria stabilized zirconia (YSZ) thin films.

Oxygen tracer diffusion along interfaces of strained Y2O3/YSZ multilayers.

The separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layers.

Measurement of the across-plane conductivity of YSZ thin films on silicon.

P304

14319-14336

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P31

scholarly article

P356

10.1039/C7CP02017A

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P407

English

P433

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P478

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P50

John A. Kilner

P577

2017-06-01T00:00:00Z

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P698

28537623

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P921

microstructure