The Topografiner: An Instrument for Measuring Surface Microtopography
about
Opportunities in high-speed atomic force microscopy.Invited review article: A 10 mK scanning probe microscopy facility.Simulations and measurements in scanning electron microscopes at low electron energy.Spin-polarised electrons in a one-magnet-only Mott spin junction.Scaling theory of electric-field-assisted tunnelling.Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy.Scanning probe microscopes go video rate and beyondScanning tunneling microscopy—from birth to adolescenceNear field emission scanning tunneling microscopy
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P2860
The Topografiner: An Instrument for Measuring Surface Microtopography
description
article
@en
im Juli 1972 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в липні 1972
@uk
ലേഖനം
@ml
name
The Topografiner: An Instrument for Measuring Surface Microtopography
@en
The Topografiner: An Instrument for Measuring Surface Microtopography
@nl
type
label
The Topografiner: An Instrument for Measuring Surface Microtopography
@en
The Topografiner: An Instrument for Measuring Surface Microtopography
@nl
prefLabel
The Topografiner: An Instrument for Measuring Surface Microtopography
@en
The Topografiner: An Instrument for Measuring Surface Microtopography
@nl
P2093
P356
P1476
The Topografiner: An Instrument for Measuring Surface Microtopography
@en
P2093
Fredric Scire
Russell Young
P304
P356
10.1063/1.1685846
P577
1972-07-01T00:00:00Z