Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions
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Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions
description
im Dezember 2016 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
@nl
наукова стаття, опублікована в грудні 2016
@uk
name
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@en
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@nl
type
label
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@en
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@nl
prefLabel
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@en
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@nl
P2093
P2860
P356
P1433
P1476
Stability, sub-gap current, 1/ ...... perconducting tunnel junctions
@en
P2093
I. J. Maasilta
J. K. Julin
S. Chaudhuri
P2860
P304
P356
10.1063/1.4972205
P577
2016-12-01T00:00:00Z