Kelvin probe force microscopy of semiconductor surface defects
about
Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy.Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations.New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.Surface photovoltage spectroscopy in a Kelvin probe force microscope under ultrahigh vacuum.Understanding the atomic-scale contrast in Kelvin probe force microscopy.Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures.Local surface potential of π-conjugated nanostructures by Kelvin probe force microscopy: effect of the sampling depthQuantitative determination of local potential values in inhomogeneously doped semiconductors by scanning tunneling microscopyNanoscale potential distribution across multiquantum well structures: Kelvin probe force microscopy and secondary electron imaging
P2860
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P2860
Kelvin probe force microscopy of semiconductor surface defects
description
im August 2004 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в серпні 2004
@uk
name
Kelvin probe force microscopy of semiconductor surface defects
@en
Kelvin probe force microscopy of semiconductor surface defects
@nl
type
label
Kelvin probe force microscopy of semiconductor surface defects
@en
Kelvin probe force microscopy of semiconductor surface defects
@nl
prefLabel
Kelvin probe force microscopy of semiconductor surface defects
@en
Kelvin probe force microscopy of semiconductor surface defects
@nl
P2093
P1433
P1476
Kelvin probe force microscopy of semiconductor surface defects
@en
P2093
R. Shikler
Th. Glatzel
Y. Rosenwaks
P2860
P356
10.1103/PHYSREVB.70.085320
P407
P577
2004-08-01T00:00:00Z