New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
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Phantom Force Induced by Tunneling Current: A Characterization on Si(111)Mapping the electrostatic force field of single molecules from high-resolution scanning probe imagesFull data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real spaceKelvin probe force microscopy study of a Pt/TiO2 catalyst model placed in an atmospheric pressure of N2 environment.Recent advances in submolecular resolution with scanning probe microscopy.Potential sensitivities in frequency modulation and heterodyne amplitude modulation Kelvin probe force microscopes.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy.Solid-state electrochemistry on the nanometer and atomic scales: the scanning probe microscopy approach.Atomic structures of silicene layers grown on Ag(111): scanning tunneling microscopy and noncontact atomic force microscopy observations.Observing optical plasmons on a single nanometer scale.Electronegativity determination of individual surface atoms by atomic force microscopy.Modelling of 'sub-atomic' contrast resulting from back-bonding on Si(111)-7×7.Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.Apparent Reversal of Molecular Orbitals Reveals Entanglement.The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations.Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures.Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy.Scanning nonlinear dielectric potentiometry.Artifacts in time-resolved Kelvin probe force microscopy.Imaging the charge distribution within a single moleculeMultiscale approach for simulations of Kelvin probe force microscopy with atomic resolutionSurface potential of diamond and gold nanoparticles can be locally switched by surrounding materials or applied voltageSwitching polarity of oxidized detonation diamond nanoparticles on substratesLocal contact potential difference of molecular self-assemblies investigated by Kelvin probe force microscopySurface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force MicroscopyThe weight function for charges—A rigorous theoretical concept for Kelvin probe force microscopyInterplay of Conductance, Force, and Structural Change in Metallic Point Contacts
P2860
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P2860
New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.
description
2009 nî lūn-bûn
@nan
2009年の論文
@ja
2009年学术文章
@wuu
2009年学术文章
@zh
2009年学术文章
@zh-cn
2009年学术文章
@zh-hans
2009年学术文章
@zh-my
2009年学术文章
@zh-sg
2009年學術文章
@yue
2009年學術文章
@zh-hant
name
New insights on atomic-resolut ...... opy imaging of semiconductors.
@en
New insights on atomic-resolut ...... opy imaging of semiconductors.
@nl
type
label
New insights on atomic-resolut ...... opy imaging of semiconductors.
@en
New insights on atomic-resolut ...... opy imaging of semiconductors.
@nl
prefLabel
New insights on atomic-resolut ...... opy imaging of semiconductors.
@en
New insights on atomic-resolut ...... opy imaging of semiconductors.
@nl
P2093
P2860
P50
P1476
New insights on atomic-resolut ...... opy imaging of semiconductors.
@en
P2093
Chung-Kai Fang
Masayuki Abe
Seizo Morita
Yoshiaki Sugimoto
Yusaku Yamada
P2860
P304
P356
10.1103/PHYSREVLETT.103.266103
P407
P577
2009-12-28T00:00:00Z