Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis
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A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.Modeling scanning probe microscope lateral dynamics using the probe-surface interaction signal.Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges.
P2860
Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis
description
article
@en
im Januar 2008 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в січні 2008
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name
Simulation of dynamics-couplin ...... order finite element analysis
@en
Simulation of dynamics-couplin ...... order finite element analysis
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type
label
Simulation of dynamics-couplin ...... order finite element analysis
@en
Simulation of dynamics-couplin ...... order finite element analysis
@nl
prefLabel
Simulation of dynamics-couplin ...... order finite element analysis
@en
Simulation of dynamics-couplin ...... order finite element analysis
@nl
P356
P1476
Simulation of dynamics-couplin ...... order finite element analysis
@en
P2093
Johannes Maess
P2860
P304
P356
10.1063/1.2826428
P577
2008-01-01T00:00:00Z