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Q34065236-BDFE81D4-4E36-46BD-923D-9E7C58721D78
Q34065236-BDFE81D4-4E36-46BD-923D-9E7C58721D78
BestRank
Statement
http://www.wikidata.org/entity/statement/Q34065236-BDFE81D4-4E36-46BD-923D-9E7C58721D78
Alternating-current induced thermal fatigue of gold interconnects with nanometer-scale thickness and width.
P2860
Q34065236-BDFE81D4-4E36-46BD-923D-9E7C58721D78
BestRank
Statement
http://www.wikidata.org/entity/statement/Q34065236-BDFE81D4-4E36-46BD-923D-9E7C58721D78
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Statement
wasDerivedFrom
9970c93e15c3a92d22e6d962eab73246080d0a8b
P2860
Recent advances on electromigration in very-large-scale-integration of interconnects