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Q38645130-10F8FB6C-A326-43F0-8F1A-F4F63FB715EB
Q38645130-10F8FB6C-A326-43F0-8F1A-F4F63FB715EB
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http://www.wikidata.org/entity/statement/Q38645130-10F8FB6C-A326-43F0-8F1A-F4F63FB715EB
Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension.
P2860
Q38645130-10F8FB6C-A326-43F0-8F1A-F4F63FB715EB
BestRank
Statement
http://www.wikidata.org/entity/statement/Q38645130-10F8FB6C-A326-43F0-8F1A-F4F63FB715EB
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6bd179a072a3d3fadc045bfb4fac19fcb0e9524e
P2860
A method to construct dose-response curves for a wide range of environmental factors and plant traits by means of a meta-analysis of phenotypic data.