Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension.
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Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension.
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name
Non-destructive measurement of ...... hythms in the third dimension.
@en
type
label
Non-destructive measurement of ...... hythms in the third dimension.
@en
prefLabel
Non-destructive measurement of ...... hythms in the third dimension.
@en
P2093
P2860
P1476
Non-destructive measurement of ...... rhythms in the third dimension
@en
P2093
Johannes Pfeifer
Michael Friedli
Norbert Kirchgessner
P2860
P2888
P304
P356
10.1007/S10265-017-0967-8
P577
2017-08-02T00:00:00Z