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1
Q38645130-455AB58A-3454-45C8-8591-B74B3612DDBD
Q38645130-455AB58A-3454-45C8-8591-B74B3612DDBD
BestRank
Statement
http://www.wikidata.org/entity/statement/Q38645130-455AB58A-3454-45C8-8591-B74B3612DDBD
Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension.
P433
Q38645130-455AB58A-3454-45C8-8591-B74B3612DDBD
BestRank
Statement
http://www.wikidata.org/entity/statement/Q38645130-455AB58A-3454-45C8-8591-B74B3612DDBD
rank
NormalRank
type
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Statement
wasDerivedFrom
81891b6be39fc2209c1170817afaef18d9272a24
P433
1
http://www.w3.org/2001/XMLSchema#string