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Q54374247-14DC05EE-8987-4DB2-9426-14263B2B4A01
Q54374247-14DC05EE-8987-4DB2-9426-14263B2B4A01
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http://www.wikidata.org/entity/statement/Q54374247-14DC05EE-8987-4DB2-9426-14263B2B4A01
The effects of lattice strain, dislocations, and microstructure on the transport properties of YSZ films.
P2860
Q54374247-14DC05EE-8987-4DB2-9426-14263B2B4A01
BestRank
Statement
http://www.wikidata.org/entity/statement/Q54374247-14DC05EE-8987-4DB2-9426-14263B2B4A01
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f6b5567ee065d33b2c8a929b1ad03115c42e82a6
P2860
Measurement of the across-plane conductivity of YSZ thin films on silicon.