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Q54374247-66ACB0DE-E89E-431A-92DD-73618BB30ECD
Q54374247-66ACB0DE-E89E-431A-92DD-73618BB30ECD
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http://www.wikidata.org/entity/statement/Q54374247-66ACB0DE-E89E-431A-92DD-73618BB30ECD
The effects of lattice strain, dislocations, and microstructure on the transport properties of YSZ films.
P2860
Q54374247-66ACB0DE-E89E-431A-92DD-73618BB30ECD
BestRank
Statement
http://www.wikidata.org/entity/statement/Q54374247-66ACB0DE-E89E-431A-92DD-73618BB30ECD
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f6b5567ee065d33b2c8a929b1ad03115c42e82a6
P2860
Edge dislocation slows down oxide ion diffusion in doped CeO₂ by segregation of charged defects.