Continuum models of focused electron beam induced processing
about
Focused particle beam-induced processing.Synthesis of [{AgO2CCH2OMe(PPh3)} n ] and theoretical study of its use in focused electron beam induced deposition.Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac) metal precursors deposited by FEBID.Modelling focused electron beam induced deposition beyond Langmuir adsorption.Dynamic Pattern Formation in Electron-Beam-Induced Etching.Formation mechanisms of boron oxide films fabricated by large-area electron beam-induced deposition of trimethyl borate.Pattern generation for direct-write three-dimensional nanoscale structures via focused electron beam induced deposition
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Q43154117-80D0E048-1565-4D4B-8005-79044F529FE4Q47138127-F9FFD69F-BCC4-4CA5-B899-E45A507AAB7BQ49241302-A6E19DF6-A1A7-4954-B2CC-31CA934FAC52Q49524382-67DDA12E-922B-459F-9DAE-150BCE9454CCQ50744860-E6F750C6-B802-4335-A645-8568BD470EE1Q54960014-2F09CE2C-EB91-403D-803B-C4E691751B48Q57821120-39DAA994-7324-40A1-8E61-B918AF47058D
P2860
Continuum models of focused electron beam induced processing
description
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Continuum models of focused electron beam induced processing
@ast
Continuum models of focused electron beam induced processing
@en
Continuum models of focused electron beam induced processing
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label
Continuum models of focused electron beam induced processing
@ast
Continuum models of focused electron beam induced processing
@en
Continuum models of focused electron beam induced processing
@nl
prefLabel
Continuum models of focused electron beam induced processing
@ast
Continuum models of focused electron beam induced processing
@en
Continuum models of focused electron beam induced processing
@nl
P2093
P2860
P356
P1476
Continuum models of focused electron beam induced processing
@en
P2093
Aleksandra Szkudlarek
Vinzenz Friedli
P2860
P304
P356
10.3762/BJNANO.6.157
P407
P577
2015-07-14T00:00:00Z