Development of Aberration-Corrected Electron Microscopy

Development of Aberration-Corrected Electron Microscopy

Item
http://www.wikidata.org/entity/Q29037973
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEM.High-resolution low-dose scanning transmission electron microscopy.Atomic electron tomography: 3D structures without crystals.The first years of the aberration-corrected electron microscopy century.Studying atomic structures by aberration-corrected transmission electron microscopy.Imaging of self-assembled structures: interpretation of TEM and cryo-TEM images.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples.
P2860

Development of Aberration-Corrected Electron Microscopy

Item
http://www.wikidata.org/entity/Q29037973
description
2008 nî lūn-bûn
@nan
2008 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2008 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2008年の論文
@ja
2008年論文
@yue
2008年論文
@zh-hant
2008年論文
@zh-hk
2008年論文
@zh-mo
2008年論文
@zh-tw
2008年论文
@wuu
name
Development of Aberration-Corrected Electron Microscopy
@ast
Development of Aberration-Corrected Electron Microscopy
@en
type
label
Development of Aberration-Corrected Electron Microscopy
@ast
Development of Aberration-Corrected Electron Microscopy
@en
prefLabel
Development of Aberration-Corrected Electron Microscopy
@ast
Development of Aberration-Corrected Electron Microscopy
@en
P1433
P1476
P2093
P2860
P304
P31
P356
P433
P478
P577
P698
P356
P1433
P1476
Development of Aberration-Corrected Electron Microscopy
@en
P2093
P2860
P304
P31
P356
P433
P478
P577
P698