Sub-ångstrom resolution using aberration corrected electron optics.
about
Examining elemental surface enrichment in ultrafine aerosol particles using analytical scanning transmission electron microscopyAtomic-Resolution Imaging with a Sub-50-pm Electron ProbeElectron tomography at 2.4-ångström resolutionNanofabrication by advanced electron microscopy using intense and focused beam∗Development of Aberration-Corrected Electron MicroscopyAtomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy.A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy.Electric field imaging of single atoms.The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.Aberration correction past and present.Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy.Low-dose aberration corrected cryo-electron microscopy of organic specimens.Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy.Nanoscale 3D cellular imaging by axial scanning transmission electron tomography.Electron cryotomographySurface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.A fast image simulation algorithm for scanning transmission electron microscopy.High-resolution low-dose scanning transmission electron microscopy.Quantitative high-resolution transmission electron microscopy of single atoms.Direct observation of crystal defects in an organic molecular crystals of copper hexachlorophthalocyanine by STEM-EELSDirect observation of the initial process of Ostwald ripening using spherical aberration-corrected transmission electron microscopy.Data processing for atomic resolution electron energy loss spectroscopy.DNA base identification by electron microscopy.Monochromated STEM with a 30 meV-wide, atom-sized electron probe.Interfacial atomic structure analysis at sub-angstrom resolution using aberration-corrected STEMDevelopment of Cs and Cc correctors for transmission electron microscopy.Unlocking the time resolved nature of electron microscopy.Graphene structures at an extreme degree of buckling.Scanning confocal electron energy-loss microscopy using valence-loss signals.Dispersion management of anisotropic metamirror for super-octave bandwidth polarization conversionToward 10 meV electron energy-loss spectroscopy resolution for plasmonics.Bridging the imaging gap: visualizing subcellular architecture with electron tomography.Vibrational spectroscopy in the electron microscope.Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning.Quantum-trajectory Monte Carlo method for study of electron-crystal interaction in STEM.Three-dimensional coordinates of individual atoms in materials revealed by electron tomography.Advanced electron microscopy characterization of nanostructured heterogeneous catalysts.Deciphering the physics and chemistry of perovskites with transmission electron microscopy.
P2860
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P2860
Sub-ångstrom resolution using aberration corrected electron optics.
description
2002 nî lūn-bûn
@nan
2002 թուականի Օգոստոսին հրատարակուած գիտական յօդուած
@hyw
2002 թվականի օգոստոսին հրատարակված գիտական հոդված
@hy
2002年の論文
@ja
2002年論文
@yue
2002年論文
@zh-hant
2002年論文
@zh-hk
2002年論文
@zh-mo
2002年論文
@zh-tw
2002年论文
@wuu
name
Sub-ångstrom resolution using aberration corrected electron optics.
@ast
Sub-ångstrom resolution using aberration corrected electron optics.
@en
type
label
Sub-ångstrom resolution using aberration corrected electron optics.
@ast
Sub-ångstrom resolution using aberration corrected electron optics.
@en
prefLabel
Sub-ångstrom resolution using aberration corrected electron optics.
@ast
Sub-ångstrom resolution using aberration corrected electron optics.
@en
P2093
P2860
P356
P1433
P1476
Sub-ångstrom resolution using aberration corrected electron optics.
@en
P2093
P2860
P2888
P304
P356
10.1038/NATURE00972
P407
P577
2002-08-01T00:00:00Z
P5875
P6179
1046331394