Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments.
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High-frequency multimodal atomic force microscopy.Laser actuation of cantilevers for picometre amplitude dynamic force microscopy.Photothermal excitation setup for a modified commercial atomic force microscope.Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.An ultra-low noise optical head for liquid environment atomic force microscopy.Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range.A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures.Calibration of higher eigenmodes of cantilevers.Generalized Hertz model for bimodal nanomechanical mappingActuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities.Contact resonance atomic force microscopy imaging in air and water using photothermal excitation.Improved spatial resolution for spot sampling in thermal desorption atomic force microscopy - mass spectrometry via rapid heating functions.Daniell method for power spectral density estimation in atomic force microscopy.Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy.Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: the dip-df modeResolving amorphous solid-liquid interfaces by atomic force microscopy
P2860
Q30419084-11DB46BD-2B88-4DA7-996C-ACB826D0B7D4Q30435181-66113DCD-825B-4892-A724-AFC4404AD556Q35110218-3E1ACD00-2CC8-4D9F-8935-9A5A5A945F31Q35733138-3FE16365-1520-47A5-9513-95633E305155Q35761487-DC2CADDB-F4C2-4EBA-9750-C1050E5ED3E7Q36266579-7C57BB9B-C80C-48DE-8509-AAF81E5BF02DQ38706255-53E13C8C-F137-493F-BDED-ACFD20AD2574Q38836094-3A2EB1F2-5E0C-46F4-B157-7760C0082EE6Q39467784-C8561E1A-8645-4F68-9848-DE81DC5D83AAQ45173149-54416549-99AE-4F99-8071-BC2D91333BB9Q46000205-B459BABD-C342-4C19-8008-1BC977BE92B7Q46380277-1454D25D-869C-46F9-97B3-3FD88110232EQ50675946-4406CBF2-3403-4203-9866-F70CC3CEDCF7Q53316746-56309FA4-3100-4D6D-A346-40D911BA2352Q57217157-F2EF82B9-1A1B-47EB-80B1-81A0DAEDF367Q58066067-55CA1249-6B31-43F2-8C3D-01CC44B1EFED
P2860
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments.
description
2012 nî lūn-bûn
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2012 թուականի Մայիսին հրատարակուած գիտական յօդուած
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2012 թվականի մայիսին հրատարակված գիտական հոդված
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2012年の論文
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2012年論文
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2012年論文
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2012年論文
@zh-hk
2012年論文
@zh-mo
2012年論文
@zh-tw
2012年论文
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name
Retrofitting an atomic force m ...... esponse in low Q environments.
@ast
Retrofitting an atomic force m ...... esponse in low Q environments.
@en
Retrofitting an atomic force m ...... esponse in low Q environments.
@nl
type
label
Retrofitting an atomic force m ...... esponse in low Q environments.
@ast
Retrofitting an atomic force m ...... esponse in low Q environments.
@en
Retrofitting an atomic force m ...... esponse in low Q environments.
@nl
prefLabel
Retrofitting an atomic force m ...... esponse in low Q environments.
@ast
Retrofitting an atomic force m ...... esponse in low Q environments.
@en
Retrofitting an atomic force m ...... esponse in low Q environments.
@nl
P2093
P2860
P356
P1476
Retrofitting an atomic force m ...... response in low Q environments
@en
P2093
Aleksander Labuda
Kei Kobayashi
Peter Grütter
P2860
P304
P356
10.1063/1.4712286
P407
P577
2012-05-01T00:00:00Z