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Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy.Field deposition from metallic tips onto insulating substrates.Excited-state spectroscopy on an individual quantum dot using atomic force microscopy.Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments.Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy.Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy.Rapid Mechanically Controlled Rewiring of Neuronal Circuits.Improved atomic force microscopy cantilever performance by partial reflective coating.Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques.Room-temperature single-electron charging detected by electrostatic force microscopy.Quantum state readout of individual quantum dots by electrostatic force detection.One-to-one spatially matched experiment and atomistic simulations of nanometre-scale indentation.Cantilever-based sensing: the origin of surface stress and optimization strategiesReview of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurementsCalibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsRelating Franck-Condon blockade to redox chemistry in the single-particle pictureScanning gate imaging of two coupled quantum dots in single-walled carbon nanotubesMinimum Threshold for Incipient Plasticity in the Atomic-Scale Nanoindentation of Au(111)Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metalsLayer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surfaceStochastic noise in atomic force microscopyStrong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum DotHighQoptical fiber tips for NC-AFM in liquidDetection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force MicroscopyAmplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe MicroscopyAn apparatus based on an atomic force microscope for implementing tip-controlled local breakdownFully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface
P50
Q31042638-8FF32787-F8BE-46DE-83ED-302BCA395337Q34006414-22C5CC50-DCAF-4748-9B61-B9D8CA1F08E1Q34060146-991D3EF3-BA06-4960-93A5-C64400BAA8F6Q34112212-B517F8AA-7999-4A8F-AF1D-4C55AA01134DQ34293275-EDB565A6-CB10-47A8-AD10-9CDA25D03D78Q35575255-DD82C5B2-0084-4FB7-9797-4E66163E8168Q36408980-66128102-BCAE-484C-9761-D2C03FF05FDDQ36480290-A42E96A1-86C8-4604-BBBF-DD002F55EAB6Q42348598-8025C535-107A-4E6A-B427-5A9FBEB59710Q45976044-C71D5E8B-CB3E-478F-B89D-0E3EF398E3F8Q46200349-4D6D05DA-5B15-4F22-9D9A-BF5A30E6CC37Q53734444-BEE659E1-5B29-4654-B74E-DE39AC33CA31Q54446023-B40B2DB8-574D-469B-B21D-587E499F0038Q57091784-EA5A2B45-0745-4A19-A034-D8433A234EDEQ62395611-48B55D68-D7EE-40B3-821D-07A11A70ECF8Q62395612-82C014BF-EBF9-4473-B0C4-2A9B1BE97713Q62395616-6878EF33-91F3-4CF8-97BB-E1CAAD92D229Q62395626-610EB4AB-E6E7-4D5D-B3F4-C516C8EBFB9EQ62395627-179EE073-C1AC-4DA0-B248-114737FB52B1Q62395635-7E3F193D-A9B9-4A86-8BC1-7860823EFAD1Q62395639-9C67666C-89E5-4C68-ABE8-5D76BA11B917Q62395641-2D2EC331-CB26-43E0-895B-063502B76F84Q62395646-0F248365-95C4-47A6-9866-1255D5262114Q62395648-31BAF1E8-272D-40A6-8F78-17AED272E5C0Q62395653-B8513AB7-54D8-4D87-B246-66269053C84DQ90802596-40C3CDA9-59F9-45F0-85BB-2BEF8E3A22C0Q92363314-9DE418AB-7C84-4B07-8C59-DD772543B403Q92722160-88AFBFF7-896C-44C2-8E9C-83E51E48B960
P50
description
researcher
@en
wetenschapper
@nl
հետազոտող
@hy
name
Yoichi Miyahara
@ast
Yoichi Miyahara
@en
Yoichi Miyahara
@es
Yoichi Miyahara
@nl
type
label
Yoichi Miyahara
@ast
Yoichi Miyahara
@en
Yoichi Miyahara
@es
Yoichi Miyahara
@nl
prefLabel
Yoichi Miyahara
@ast
Yoichi Miyahara
@en
Yoichi Miyahara
@es
Yoichi Miyahara
@nl
P106
P1153
8226301600
P31
P496
0000-0002-9514-9603